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서명 :

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization 2Vols

저자 :

Haight

ISBN :

9814322806

ISBN-13 :

9789814322805

출판년 :

2012

출판사 :

World Scientific

페이지 :

312 pages

제본형태 :

Hardcover

가 격 :

USD 514.00

판매가 :

\667,320원

도서 상태 :

3-4일 배송 가능

주문 :

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  도 서 정 보

?Electron Microscopies:
?Characterization of Semiconductor Nanostructures by Scanning Electron Microscopy (Lynne M Gignac & Oliver C Wells)
?Transmission Electron Microscopy and Ultra-high Vacuum Transmission Electron Microscopy of Semiconductor Nanostructures (Suneel Kodambaka & Frances M Ross)
?Aberration Corrected Electron Microscopy (Philip E Batson)
?Low-Energy Electron Microscopy for Nanoscale Characterization (James B Hannon & Rudolf M Tromp)
?Ultrafast Microscopy of Plasmon Dynamics in Nanostructured Metal Surfaces (Hrvoje Petek & Atsushi Kubo)
?X-Ray Diffraction Methods for Studying Strain and Composition in Epitaxial Nanostructured Systems (Angelo Malachias, Raul Freitas, Sergio L Morelhao, Rogerio Magalhaes-Paniago, Stefan Kycia & Gilberto Medeiros-Ribeiro)
?Stress Determination in Semiconductor Nanostructures Using X-Ray Diffraction (Conal E Murry & I Cevdet Noyan)

Contents:


?Scanning Probes:
?An Introduction to Scanning Probe Microscopy of Semiconductors with Case Studies Concerning Gallium Nitride and Related Materials (Rachel Oliver)
?STM of Self Assembled III-V Nanostructures (Vaishno D Dasika & Rachel S Goldman)
?Atom and Optical Probes:
?Atom Probe Tomography for Microelectronics (David J Larson, Ty J Prosa, Dan Lawrence, Brian P Geiser, Clive M Jones & Thomas F Kelly)
?Raman Spectroscopy of Carbon Nanotubes and Graphene Materials and Devices (Marcus Freitag & James C Tsang)
?Single Nanowire Photoelectron Spectroscopy (Carlos Aguilar & Richard Haight)
?Time-Domain Thermoreflectance Measurements for Thermal Property Characterization of Nanostructures (Scott Huxtable)

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